G-SIMS of thermosetting polymersHAWTIN, P. N; ABEL, M.-L; WATTS, J. F et al.Applied surface science. 2006, Vol 252, Num 19, pp 6676-6678, issn 0169-4332, 3 p.Conference Paper

Mass accuracy- : TOF-SIMSGREEN, F. M; GILMORE, I. S; SEAH, M. P et al.Applied surface science. 2006, Vol 252, Num 19, pp 6591-6593, issn 0169-4332, 3 p.Conference Paper

G-SIMS of biodegradable homo-polyestersOGAKI, R; GREEN, F; LI, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 6797-6800, issn 0169-4332, 4 p.Conference Paper

G-SIMS-FPM: molecular structure at surfaces : a combined positive and negative secondary ion studyGILMORE, I. S; GREEN, F. M; SEAH, M. P et al.Applied surface science. 2006, Vol 252, Num 19, pp 6601-6604, issn 0169-4332, 4 p.Conference Paper

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometrySEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 7, pp 634-643, issn 0142-2421, 10 p.Article

Static TOF-SIMS. A VAMS interlaboratory study. Part II accuracy of the mass scale and G-SIMS compatibilityGILMORE, I. S; GREEN, F. M; SEAH, M. P et al.Surface and interface analysis. 2007, Vol 39, Num 10, pp 817-825, issn 0142-2421, 9 p.Article

Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powersHEILE, A; MUHMANN, C; LIPINSKY, D et al.Applied surface science. 2012, Vol 258, Num 18, pp 6993-6999, issn 0169-4332, 7 p.Article

Probing thin over layers with variable energy/cluster ion beamsSPOOL, A; WHITE, R.Applied surface science. 2006, Vol 252, Num 19, pp 6517-6520, issn 0169-4332, 4 p.Conference Paper

Organic molecule characterization: G-SIMSGILMORE, I. S; SEAH, M. P.Applied surface science. 2004, Vol 231-32, pp 224-229, issn 0169-4332, 6 p.Conference Paper

Investigating the difficulty of eliminating flood gun damage in TOF-SIMSGILMORE, I. S; SEAH, M. P.Applied surface science. 2003, Vol 203-04, pp 600-604, issn 0169-4332, 5 p.Conference Paper

Multivariate image analysis strategies for ToF-SIMS images with topographyLEE, J. L. S; GILMORE, I. S; FLETCHER, I. W et al.Surface and interface analysis. 2009, Vol 41, Num 8, pp 653-665, issn 0142-2421, 13 p.Article

Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systemsLEE, J. L. S; GILMORE, I. S; SEAH, M. P et al.Surface and interface analysis. 2008, Vol 40, Num 1, pp 1-14, issn 0142-2421, 14 p.Article

Cluster ion sputtering : molecular ion yield relationships for different cluster primary ions in static SIMS of organic materialsSEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 11, pp 890-897, issn 0142-2421, 8 p.Article

Static SIMS studies of fatty alcohols, amines and esters on gold and aluminium-magnesium alloy surfacesMILLER, D. J; SUN, L; WALZAK, M. J et al.Surface and interface analysis. 2005, Vol 37, Num 5, pp 499-508, issn 0142-2421, 10 p.Article

Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMSSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 228-235, issn 0142-2421, 8 p.Conference Paper

Static SIMS-VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantificationGREEN, F. M; GILMORE, I. S; LEE, J. L. S et al.Surface and interface analysis. 2010, Vol 42, Num 3, pp 129-138, issn 0142-2421, 10 p.Article

A comparison of the static SIMS and G-SIMS spectra of biodegradable homo-polyestersOGAKI, R; GREEN, F. M; LI, S et al.Surface and interface analysis. 2008, Vol 40, Num 8, pp 1202-1208, issn 0142-2421, 7 p.Article

Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clustersGUANGTAO LI; CYRIAC, Jobin; LIANG GAO et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 498-501, issn 0142-2421, 4 p.Conference Paper

Enhancement of the static SIMS secondary ion yields of lipid moieties by ultrathin gold coating of aged oil paint surfacesKEUNE, K; BOON, J. J.Surface and interface analysis. 2004, Vol 36, Num 13, pp 1620-1628, issn 0142-2421, 9 p.Article

Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blendGILMORE, I. S; SEAH, M. P; JOHNSTONE, J. E et al.Surface and interface analysis. 2003, Vol 35, Num 11, pp 888-896, issn 0142-2421, 9 p.Article

Topography and field effects in secondary ion mass spectrometry Part II: insulating samplestLEE, J. L. S; GILMORE, I. S; SEAH, M. P et al.Surface and interface analysis. 2012, Vol 44, Num 2, pp 238-245, issn 0142-2421, 8 p.Article

Analysis of thin films and molecular orientation using cluster SIMSGREEN, Felicia M; SEAH, Martin P; GILMORE, Ian S et al.Surface and interface analysis. 2011, Vol 43, Num 9, pp 1224-1230, issn 0142-2421, 7 p.Article

Topography and Field Effects in Secondary Ion Mass Spectrometry ― Part I: Conducting SamplesLEE, Joanna L. S; GILMORE, Ian S; SEAH, Martin P et al.Journal of the American Society for Mass Spectrometry. 2011, Vol 22, Num 10, pp 1718-1728, issn 1044-0305, 11 p.Article

Characterization of lubricants for fluid dynamic bearing by TOF-SIMSTOUJOU, F; TSUKAMOTO, K; MATSUOKA, K et al.Applied surface science. 2003, Vol 203-04, pp 590-595, issn 0169-4332, 6 p.Conference Paper

Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMSVAN HAM, Rita; VAN VAECK, Luc; ADAMS, Freddy et al.Analytical and bioanalytical chemistry. 2005, Vol 383, Num 6, pp 991-997, 7 p.Article